Scipediacontent: Scipediacontent moved page Draft Content 810573359 to Boutillon et al 2010a

2021-01-28T16:11:57Z

Scipediacontent moved page Draft Content 810573359 to Boutillon et al 2010a

Scipediacontent: Created page with " == Abstract == International audience; With the rapid size shrinking in electronic devices,radiation-induced soft-error has emerged as a major concern to the current circuit..."

2021-01-28T16:11:52Z

Created page with " == Abstract == International audience; With the rapid size shrinking in electronic devices,radiation-induced soft-error has emerged as a major concern to the current circuit..."

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== Abstract ==

International audience; With the rapid size shrinking in electronic devices,radiation-induced soft-error has emerged as a major concern to the current circuit manufacturing. In this paper, we present a new error correction scheme based on the residue number arithmetic to cope with the single soft-error issue. The proposed technique called bidirectional redundant residue number system requires the redundant moduli to satisfy some constraints to achieve fast error correction. In this system, both the iterations for decoding the valid number and the error-correcting table that contains all combinations of erroneous digit, are not necessary. The detection and the diagnosis are simultaneously performed in plural parallel consistent-checking that has the capability of locating the corrupt digit. Finally, efficient pipeline architecture for the self-diagnosis decoder is detailed.

== Original document ==

The different versions of the original document can be found in:

* [https://hal.archives-ouvertes.fr/hal-01170765 https://hal.archives-ouvertes.fr/hal-01170765]

* [http://www-labsticc.univ-ubs.fr/~boutillon/articles/DASIP%2010_self_correction.pdf http://www-labsticc.univ-ubs.fr/~boutillon/articles/DASIP%2010_self_correction.pdf],
: [https://hal.archives-ouvertes.fr/hal-01170765 https://hal.archives-ouvertes.fr/hal-01170765],
: [http://yadda.icm.edu.pl/yadda/element/bwmeta1.element.ieee-000005706242 http://yadda.icm.edu.pl/yadda/element/bwmeta1.element.ieee-000005706242],
: [https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5706242 https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5706242],
: [https://dblp.uni-trier.de/db/conf/dasip/dasip2010.html#TangBJJ10 https://dblp.uni-trier.de/db/conf/dasip/dasip2010.html#TangBJJ10],
: [https://hal-pasteur.archives-ouvertes.fr/LAB-STICC_ENIB/hal-01170765 https://hal-pasteur.archives-ouvertes.fr/LAB-STICC_ENIB/hal-01170765],
: [https://academic.microsoft.com/#/detail/2166418032 https://academic.microsoft.com/#/detail/2166418032]

* [http://xplorestaging.ieee.org/ielx5/5692849/5706235/05706242.pdf?arnumber=5706242 http://xplorestaging.ieee.org/ielx5/5692849/5706235/05706242.pdf?arnumber=5706242],
: [http://dx.doi.org/10.1109/dasip.2010.5706242 http://dx.doi.org/10.1109/dasip.2010.5706242]

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Boutillon et al 2010a - Revision history

Scipediacontent: Scipediacontent moved page Draft Content 810573359 to Boutillon et al 2010a

Scipediacontent: Created page with " == Abstract == International audience; With the rapid size shrinking in electronic devices,radiation-induced soft-error has emerged as a major concern to the current circuit..."